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Title of the Paper: Tool Development for Analysis of WCDMA Radio Measurements and Investigation of EcNo and RSCP values before Drop Call
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Authors: Evangelos A. Kokkinos, Emmanouil Michalodimitrakis,
Theodosia Hohlidaki, Emilia Fotinopoulou, John Makris
Abstract: In this work, a tool was developed for the post processing analysis of the drive test measurement files. This tool collects all the necessary information from measurement files and organizes this information to a data base. The tool plots of the Received Signal Code Power (RSCP) measurements on the map along the route of the car, using a color code. The RSCP measurement can be either the RSCP of the best server or the RSCP of a certain Cell. Moreover, a very important plot is also available, the plot which shows where are the interference measurement samples on the map. Finally, an investigation of the EcNo and RSCP values exactly before drop call was done using a large list of measurement files, in order to optimise operator’s parameters of the handover algorithm.
Keywords: WCDMA, CPICH, RSCP, EcNo, RSSI, Soft Handover.
Title of the Paper: A CMOS Gm-C State-Space 1MHz Low-Pass Active Filter
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Authors: Elena Doicaru, Dan-Ovidiu Andrei
Abstract: In this paper are presented a CMOS Gm-C state-space active filter for high frequencies, in the
1μm CMOS process, synthesised using the intermediate transfer function method. The Gm transconductor has
a good linearity (1% relative error for 2Vp-p input signals with a 5V power supply) and high DC gain (640dB),
combined with a large band to avoid errors in the filter characteristic. By using the intermediate transfer
functions method, the active filter performances - as sensitivity and dynamic range (noise) - are optimised.
The 1 MHz low-pass filter has the dynamic range grater than 70db and the total harmonic distortion lower
than –60 dB.
Keywords: synthesis, active filters, intermediate transfer function synthesis method
Title of the Paper: Tolerances Analysis of MOSFET Integrated Circuits Performances
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Authors: F.Vallette, P.Garda, S.Feruglio, G.Vasilescu
Abstract: In the design and optimization phase of analog integrated circuit conception, a topology is
obtained and a value is affected to each parameter of the system yielding the best performance.
However, during the manufacturing process the real values of these parameters will deviate in a more
or less important way from the computed values, which will produce fluctuations of the performance.
Tolerance analysis is needed to estimate the maximum possible fluctuations of the performance, but
most of tolerance analysis methods are only applied to systems defined by their electrical parameters,
while designers have access only to technological parameters. An efficient and original approach
consists in performing the analysis by taking into account tolerances of the technological parameters
instead of electrical parameters. This paper presents tolerance analysis method applied to analog
integrated circuit realized in CMOS technology, where the maximum fluctuations of the performance
are established with respect to tolerances of technological parameters, like dimensions or oxide
capacitance.
Keywords: Tolerance analysis, Sensitivity, MOSFET, Electrical & technological parameters,
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